DocumentCode
2050167
Title
VLIW - a case study of parallelism verification
Author
Adir, Allon ; Arbetman, Yaron ; Dubrov, Bella ; Liechtenstein, Y. ; Rimon, Michal ; Vinov, Michael ; Calligaro, Massimo A. ; Cofler, Andrew ; Duffy, Gabriel
Author_Institution
IBM Res. Lab., Haifa, Israel
fYear
2005
fDate
13-17 June 2005
Firstpage
779
Lastpage
782
Abstract
Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper we report on the verification of a very large instruction word processor. The verification team used a sophisticated test program generator that modeled the parallel aspects as sequential constraints, and augmented the tool with manually written test templates. The system created large numbers of legal stimuli, however the quality of the tests was proved insufficient by several post silicon bugs. We analyze this experience and suggest an alternative, parallel generation technique. We show through experiments the feasibility of the new technique and its superior quality along several dimensions. We claim that the results apply to other parallel architectures and verification environments.
Keywords
automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; VLIW; automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; parallel generation technique; parallelism verification; processor architecture; sequential constraints; test program generator; very large instruction word processor; Automatic programming; Computer bugs; Law; Legal factors; Parallel architectures; Process design; Sequential analysis; Silicon; System testing; VLIW;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN
1-59593-058-2
Type
conf
DOI
10.1109/DAC.2005.193921
Filename
1510441
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