• DocumentCode
    2050167
  • Title

    VLIW - a case study of parallelism verification

  • Author

    Adir, Allon ; Arbetman, Yaron ; Dubrov, Bella ; Liechtenstein, Y. ; Rimon, Michal ; Vinov, Michael ; Calligaro, Massimo A. ; Cofler, Andrew ; Duffy, Gabriel

  • Author_Institution
    IBM Res. Lab., Haifa, Israel
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    779
  • Lastpage
    782
  • Abstract
    Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper we report on the verification of a very large instruction word processor. The verification team used a sophisticated test program generator that modeled the parallel aspects as sequential constraints, and augmented the tool with manually written test templates. The system created large numbers of legal stimuli, however the quality of the tests was proved insufficient by several post silicon bugs. We analyze this experience and suggest an alternative, parallel generation technique. We show through experiments the feasibility of the new technique and its superior quality along several dimensions. We claim that the results apply to other parallel architectures and verification environments.
  • Keywords
    automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; VLIW; automatic test pattern generation; formal verification; integrated circuit testing; logic testing; microprocessor chips; parallel architectures; parallel generation technique; parallelism verification; processor architecture; sequential constraints; test program generator; very large instruction word processor; Automatic programming; Computer bugs; Law; Legal factors; Parallel architectures; Process design; Sequential analysis; Silicon; System testing; VLIW;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings. 42nd
  • Print_ISBN
    1-59593-058-2
  • Type

    conf

  • DOI
    10.1109/DAC.2005.193921
  • Filename
    1510441