Effect of electrical stresses on the susceptibility of a voltage regulator

Analog circuits such as linear voltage regulators are very sensitive to electromagnetic interferences which induce voltage offset on their outputs. In harsh environments, the aging of this component can be accelerated and could lead to an increase of the effect of electromagnetic interferences. This paper proposes an original study about the drift of the susceptibility level of a low dropout voltage regulator submitted to electrical stresses. Some analyses based on CAD simulations are proposed to explain the experimental observations.