Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

Author

Haelvoet, K. ; Criel, S. ; Dobbelaere, F. ; Martens, L. ; Langhe, P. De ; Smedt, R. De

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

Volume

2

fYear

1996

fDate

1996

Firstpage

1119

Abstract

A new in-house developed three-dimensional scanning system for measuring electromagnetic fields close to devices and systems is presented. The scanning system is able to perform translations along a three-dimensional Cartesian grid with arbitrary grid size so that any electromagnetic field component can be measured with high accuracy and detail. A near-field scan of an AT motherboard and of a telecom subsystem is described to illustrate the performance of the scanning system. The measurements show that the scanning, system is an excellent diagnostic tool for the detection of EMC problems in an early stage of product development

Keywords

automatic testing; computer equipment testing; electromagnetic compatibility; electromagnetic interference; field plotting; loop antennas; magnetic field measurement; spectral analysers; telecommunication equipment testing; AT motherboard; EMC problems; arbitrary grid size; automated measurements; diagnostic tool; early product development stage; electromagnetic fields measurement; high accuracy mesurement; loop antenna; near-field scanner; spectrum analyzer; tangential magnetic field component; telecom subsystem; three-dimensional scanning system; translations along 3D Cartesian grid; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic measurements; Information technology; Magnetic analysis; Magnetic field measurement; Performance evaluation; Probes; Size measurement; Telecommunications;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507338

Filename

507338