DocumentCode :
2050585
Title :
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Author :
Haelvoet, K. ; Criel, S. ; Dobbelaere, F. ; Martens, L. ; Langhe, P. De ; Smedt, R. De
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1119
Abstract :
A new in-house developed three-dimensional scanning system for measuring electromagnetic fields close to devices and systems is presented. The scanning system is able to perform translations along a three-dimensional Cartesian grid with arbitrary grid size so that any electromagnetic field component can be measured with high accuracy and detail. A near-field scan of an AT motherboard and of a telecom subsystem is described to illustrate the performance of the scanning system. The measurements show that the scanning, system is an excellent diagnostic tool for the detection of EMC problems in an early stage of product development
Keywords :
automatic testing; computer equipment testing; electromagnetic compatibility; electromagnetic interference; field plotting; loop antennas; magnetic field measurement; spectral analysers; telecommunication equipment testing; AT motherboard; EMC problems; arbitrary grid size; automated measurements; diagnostic tool; early product development stage; electromagnetic fields measurement; high accuracy mesurement; loop antenna; near-field scanner; spectrum analyzer; tangential magnetic field component; telecom subsystem; three-dimensional scanning system; translations along 3D Cartesian grid; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic measurements; Information technology; Magnetic analysis; Magnetic field measurement; Performance evaluation; Probes; Size measurement; Telecommunications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507338
Filename :
507338
Link To Document :
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