Title :
Structural characterization and magnetization reversal of 0.1 /spl mu/m scale antidot-type arrays patterned by Ga/sup +/ irradiation
Author :
Owen, N.W. ; Petford-Long, A.K.
Author_Institution :
Dept. of Mater., Oxford Univ., UK
fDate :
March 30 2003-April 3 2003
Abstract :
In this article, we present conventional transmission electron microscopy (TEM), Lorentz TEM and micromagnetic simulation, the relation between the structural changes accompanying the irradiation process and the magnetisation reversal of magnetic films patterned with arrays of 0.1/spl mu/m scale square antidots. The arrays have been fabricated in Co thin film as well as NiFe thin film using a focused ion beam system.
Keywords :
cobalt; ferromagnetic materials; ion beam effects; iron alloys; magnetic domains; magnetic thin films; magnetisation reversal; micromagnetics; nickel alloys; quantum dots; transmission electron microscopy; 0.1 micron; Co; Co thin film; Ga/sup +/ irradiation; Lorentz TEM; NiFe; NiFe thin film; antidot type arrays; conventional transmission electron microscopy; domain structure; focused ion beam system; irradiation process; magnetic films; magnetization reversal; micromagnetic simulation; Atomic layer deposition; Electron microscopy; Gas insulated transmission lines; Magnetic films; Magnetic force microscopy; Magnetic materials; Magnetic properties; Magnetization reversal; Sputtering; Transmission electron microscopy;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230643
