DocumentCode :
2050902
Title :
3-D electromagnetic field modeling based on near field measurements
Author :
Roczniak, Andrew ; Petriu, Emil M. ; Costache, George I.
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1124
Abstract :
This paper presents a practical 3-D electromagnetic field modeling technique based on a phaseless “near field/far field” (NF/FF) transform where field values are computed from a limited set of near field measurements taken in the vicinity of the “device under test” (DUT). A non-invasive computer vision technique for the recovery of the 3-D position parameters of the EM probe which scans the near field around the DUT is finally presented
Keywords :
Helmholtz equations; antenna radiation patterns; automatic test equipment; computer vision; dipole antenna arrays; electromagnetic interference; magnetic field measurement; modelling; signal sampling; spectral analysers; 3-D electromagnetic field modeling; 3-D position parameters; EM probe; EMC testing; EMI testing; Helmholtz equation; computer controlled measurement system; device under test vicinity; hemispherical surfaces; integral transform; model validation; near field measurements; noninvasive computer vision technique; phase retrieval problem; phaseless field/far field transform; pseudo-random binary sequences; pseudo-random encoding; spectrum analyzer; spherical wave expansion technique; transform algorithm; Computer vision; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic modeling; Magnetic field measurement; Noise measurement; Phase measurement; Probes; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507339
Filename :
507339
Link To Document :
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