• DocumentCode
    2050919
  • Title

    Study of scintillation light from microstructure based detectors

  • Author

    Fraga, M.M. ; Fetal, S.T.G. ; Fraga, F.A.F. ; Antunes, E. ; Goncalves, J. ; Bueno, C.C. ; Marques, R. Ferreira ; Policarpo, A.J.P.L.

  • Author_Institution
    Dept. de Fisica, Coimbra Univ., Portugal
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    654
  • Abstract
    In a previous work it has been pointed out that scintillation light, extending up to the infrared, emitted in microstructure based gaseous detectors (microstrips, microgaps, GEMs, etc.) can be used for non destructive testing of these detectors when they are associated to a CCD readout system. The choice of the gas mixture is an important issue, in so far as its emission spectrum should overlap efficiently the sensitivity region of the CCD (400-1100 nm). In the present work we report on a systematic study for several gas mixtures which includes measurements of the total light yields as a function of the electric field and of the spectrometric distribution of the light emitted, in the wavelength region between 250 and 930 nm. Results are presented for pure argon and argon and xenon based gas mixtures. A comparison is made between the results obtained with the CCD coupled to a GEM detector and with a gaseous scintillation proportional counter
  • Keywords
    gas mixtures; gas scintillation detectors; proportional counters; 250 to 930 nm; Ar; Ar-Xe; CCD readout system; GEM detector; GEMs; emission spectrum; gas mixtures; gaseous scintillation proportional counter; microgaps; microstrips; microstructure based detectors; microstructure based gaseous detectors; scintillation light; spectrometric distribution; Argon; Charge coupled devices; Electric variables measurement; Infrared detectors; Microstrip; Microstructure; Solid scintillation detectors; Spectroscopy; System testing; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5696-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1999.845754
  • Filename
    845754