Title :
Neutron and alpha particle-induced transients in 90 nm technology
Author :
Narasimham, Balaji ; Gadlage, Matthew J. ; Bhuva, Bharat L. ; Schrimpf, Ronald D. ; Massengill, Lloyd W. ; Holman, W. Timothy ; Witulski, Arthur F. ; Zhu, Xiaowei ; Balasubramanian, Anupama ; Wender, Steve A.
Author_Institution :
Dept. of EECS, Vanderbilt Univ., Nashville, TN
fDate :
April 27 2008-May 1 2008
Abstract :
Combinational logic soft errors are a major environment-related reliability issue in advanced CMOS processes. The key to determining logic soft error rates (SER) is detailed knowledge of neutron and alpha particle-induced single event transient (SET) pulse widths, but these pulse widths have not been measured previously. experimental results obtained using a novel test chip fabricated in a 90 -nm CMOS technology indicate the SET widths are similar to those of legitimate logic signals.
Keywords :
CMOS logic circuits; alpha-particle effects; neutron effects; CMOS processes; alpha particle-induced single event transient pulse widths; logic soft error rates; neutron particle-induced single event transient pulse widths; CMOS logic circuits; CMOS process; CMOS technology; Error analysis; Logic testing; Neutrons; Particle measurements; Pulse measurements; Semiconductor device measurement; Space vector pulse width modulation; alpha; neutron; pulse width; single event; single event transient (SET); soft error; soft error rate (SER);
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4558932
