Title :
Grain filtering in MILC and its impact on performance of n- and p-channel TFTs
Author :
Nagata, Sho ; Nakagawa, Gou ; Asano, Tanemasa
Author_Institution :
Dept. of Electron., Kyushu Univ., Fukuoka, Japan
Abstract :
Metal induced lateral crystallization (MILC) using nickel di-silicide catalyst is able to grow poly-Si films having a preferential crystal orientation along surface normal direction. The poly-Si film prepared by MILC, however, contains randomly distributed sub-grain boundaries which may degrade the performance of poly-Si TFT fabricated using the MILC film. We have investigated effects of patterning of the a-Si film prior to MILC on the growth characteristics and TFT performance. When the width of a-Si film pattern was narrowed, grain filtering effect occurred and, as a result, poly-Si islands whose active region for TFT is mostly composed of single oriented crystal were successfully grown. We characterized the film thus prepared by fabricating n and p-channel TFTs. TFTs were fabricated using the standard high temperature process. The results indicated that TFT performance is very much improved in terms of carrier mobility, on-current, and sub-threshold swing. We conclude that the pre-growth pattering of a-Si in MILC is useful technique to improve the performance of MILC TFTs.
Keywords :
carrier mobility; crystal orientation; crystallisation; elemental semiconductors; nickel compounds; semiconductor thin films; silicon; thin film transistors; NiSi2; Si; a-Si film pattern; carrier mobility; crystal orientation; grain filtering; metal induced lateral crystallization; n-channel TFT; nickel di-silicide catalyst; p-channel TFT; poly-Si films; sub-grain boundaries; Metal induced lateral crystallization (MILC); thin film transistor (TFT);
Conference_Titel :
TENCON 2010 - 2010 IEEE Region 10 Conference
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-6889-8
DOI :
10.1109/TENCON.2010.5686540