Title :
Circuit failure prediction for robust system design in scaled CMOS
Author :
Mitra, Subhasish
Author_Institution :
Depts. of Electr. Eng. & Comput. Sci., Stanford Univ., Stanford, CA
fDate :
April 27 2008-May 1 2008
Abstract :
The idea behind circuit failure prediction is to predict the occurrence of a circuit failure before errors actually appear in system data and states. This concept enables a sea change in robust system design by overcoming major reliability challenges such as circuit aging and early-life failures (infant mortality).
Keywords :
integrated circuit reliability; integrated circuit testing; circuit aging; circuit failure prediction; early-life failures; infant mortality; robust system design; Aging; Built-in self-test; Costs; Error correction; Hardware; Integrated circuit interconnections; Logic; Niobium compounds; Power system interconnection; Robustness;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4558940
