Title :
On-Chip circuit for monitoring frequency degradation due to NBTI
Author :
Stawiasz, Kevin ; Jenkins, Keith A. ; Lu, Pong-Fei
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Heights, NY
fDate :
April 27 2008-May 1 2008
Abstract :
This work describes the design and characterization of a unique circuit which can be easily integrated into a microprocessor product in order to determine the degradation of circuit speed caused by negative bias temperature instability (NBTI)-induced shifts under typical product operating voltage and temperature. These data can subsequently be compared to models for circuit degradation in order to assess the validity of the models.
Keywords :
CMOS integrated circuits; circuit stability; microprocessor chips; circuit speed degradation; microprocessor product; negative bias temperature instability; product operating temperature; product operating voltage; Circuit testing; Counting circuits; Degradation; Frequency; Monitoring; Niobium compounds; Ring oscillators; Stress; Titanium compounds; Voltage;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4558941
