DocumentCode
2051211
Title
Exact IC current extraction method using a measured voltage of a board
Author
Sangho Lim ; Sangho Lee ; Cheaok Ko ; Jongwan Shim ; Jeongnam Cheon
Author_Institution
R&D Solution Lab., Samsung Electron. Co., Suwon, South Korea
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
900
Lastpage
904
Abstract
The key to designing power distribution network (PDN) is to obtain correct current drawn by integrated circuits (IC). This paper suggests an exact IC current extraction method using a measured voltage of a board and new transfer function which reflects the effects of the scope´s noise. Voltage waveform is measured at the location where the closest decoupling capacitor from an IC would be removed in a real structure. The proposed methodology is evaluated by comparing the simulated noise voltage from the extracted current with the measured one for a 1.2V core circuit.
Keywords
distribution networks; integrated circuit design; power integrated circuits; IC current extraction method; decoupling capacitor; integrated circuits; power distribution network; transfer function; voltage 1.2 V; voltage waveform; Capacitors; Current measurement; Integrated circuit modeling; Noise; Transfer functions; Voltage measurement; IC Current; PDN; PI; Power Distribution Network; Power Integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location
Brugge
ISSN
2325-0356
Type
conf
Filename
6653429
Link To Document