Title :
Exact IC current extraction method using a measured voltage of a board
Author :
Sangho Lim ; Sangho Lee ; Cheaok Ko ; Jongwan Shim ; Jeongnam Cheon
Author_Institution :
R&D Solution Lab., Samsung Electron. Co., Suwon, South Korea
Abstract :
The key to designing power distribution network (PDN) is to obtain correct current drawn by integrated circuits (IC). This paper suggests an exact IC current extraction method using a measured voltage of a board and new transfer function which reflects the effects of the scope´s noise. Voltage waveform is measured at the location where the closest decoupling capacitor from an IC would be removed in a real structure. The proposed methodology is evaluated by comparing the simulated noise voltage from the extracted current with the measured one for a 1.2V core circuit.
Keywords :
distribution networks; integrated circuit design; power integrated circuits; IC current extraction method; decoupling capacitor; integrated circuits; power distribution network; transfer function; voltage 1.2 V; voltage waveform; Capacitors; Current measurement; Integrated circuit modeling; Noise; Transfer functions; Voltage measurement; IC Current; PDN; PI; Power Distribution Network; Power Integrity;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge