• DocumentCode
    2051292
  • Title

    Fast versatile EMC immunity model for digital IOs

  • Author

    Coru, Guillaume ; Duval, Fabrice ; Benjelloun, Nabil ; Kadi, Moncef

  • Author_Institution
    IRSEEM-Technopole du Madrillet, St. Étienne du Rouvray, France
  • fYear
    2013
  • fDate
    2-6 Sept. 2013
  • Firstpage
    920
  • Lastpage
    925
  • Abstract
    This paper presents an immunity modelling study of a 74LS04 inverter. The purpose of this work is to develop a simple model, using as little measurements as possible, and using only datasheet available data. To evaluate model precision, DPI test simulation results are compared to DPI test measurements.
  • Keywords
    electromagnetic compatibility; invertors; 74LS04 inverter; DPI test simulation; digital IO; fast versatile EMC immunity model; Europe; Immunity testing; Integrated circuit modeling; Mathematical model; Simulation; EMC model; immunity; integrated circuit; predictive-black-box modelling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
  • Conference_Location
    Brugge
  • ISSN
    2325-0356
  • Type

    conf

  • Filename
    6653433
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2051292