DocumentCode :
2051292
Title :
Fast versatile EMC immunity model for digital IOs
Author :
Coru, Guillaume ; Duval, Fabrice ; Benjelloun, Nabil ; Kadi, Moncef
Author_Institution :
IRSEEM-Technopole du Madrillet, St. Étienne du Rouvray, France
fYear :
2013
fDate :
2-6 Sept. 2013
Firstpage :
920
Lastpage :
925
Abstract :
This paper presents an immunity modelling study of a 74LS04 inverter. The purpose of this work is to develop a simple model, using as little measurements as possible, and using only datasheet available data. To evaluate model precision, DPI test simulation results are compared to DPI test measurements.
Keywords :
electromagnetic compatibility; invertors; 74LS04 inverter; DPI test simulation; digital IO; fast versatile EMC immunity model; Europe; Immunity testing; Integrated circuit modeling; Mathematical model; Simulation; EMC model; immunity; integrated circuit; predictive-black-box modelling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
ISSN :
2325-0356
Type :
conf
Filename :
6653433
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2051292
بازگشت