Title :
The conducted immunity of SPI EEPROM memories
Author :
Amellal, Mohamed ; Ramdani, Mohammed ; Perdriau, Richard ; Medina, Manel ; Drissi, M´hamed ; Ahaitouf, Ali
Author_Institution :
ESEO-EMC, ESEO Angers, Angers, France
Abstract :
This paper focus on the conducted immunity measurement of non-volatile memories up to 1 GHz. A specific measurement flow is introduced, which makes possible to compare the EMC performances in different test cases. Trough measurements and simulation, this study gives a real view on the immunity difference of this integrated circuits (IC).
Keywords :
EPROM; electromagnetic compatibility; integrated circuit manufacture; logic design; random-access storage; EMC; SPI EEPROM memories; frequency 1 GHz; immunity measurement; integrated circuits; nonvolatile memories; EPROM; Frequency measurement; Immunity testing; Integrated circuit modeling; Manufacturing;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
