DocumentCode :
2051443
Title :
Broadband measurement of the magnetic moment normal to the printed circuit board plane using TEM cell and phase information
Author :
Blecic, Raul ; Bako, Niko ; Gillon, Renaud ; Baric, Adrijan
Author_Institution :
Fac. of Electr. Eng. & Comput., Univ. of Zagreb, Zagreb, Croatia
fYear :
2013
fDate :
2-6 Sept. 2013
Firstpage :
955
Lastpage :
960
Abstract :
In this paper the measurement of the magnetic moment normal to the printed circuit board (PCB) by a Transverse Electromagnetic (TEM) cell is presented. The PCB is placed inside a TEM cell perpendicular to the septum by using two boards: a motherboard and a daughterboard. The daughterboard represents the PCB and device under test (DUT). An edge connector is vertically mounted on the motherboard to enable the placement of the daughterboard inside the TEM cell and to enable the communication between the daughterboard and the outside world. The phase information is used to distinguish between the magnetic and electric moments without using a hybrid coupler. The absence of the hybrid coupler allows to perform the measurements over a broad frequency range. The method is validated by measuring the PCB circular current loops and by comparing the results to the theory and a very good match is obtained. The complete test system consisting of the TEM cell and the loops is simulated in a full-wave electromagnetic solver and a very good match is obtained, too. The full-wave simulations are used to investigate the limitations of the presented method.
Keywords :
TEM cells; coupled circuits; electric connectors; electromagnetism; magnetic moments; printed circuit testing; DUT; PCB circular current loops; TEM cell; broadband measurement; daughterboard; device under test; edge connector; electric moments; full-wave electromagnetic solver; full-wave simulations; hybrid coupler; magnetic moment measurement; phase information; printed circuit board plane; transverse electromagnetic cell; Connectors; Couplings; Current measurement; Electromagnetic compatibility; Frequency measurement; Magnetic moments; TEM cells; EM simulations; TEM cell to open-area test site (OATS) measurements correlation; VNA measurements; magnetic loop; magnetic moment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
ISSN :
2325-0356
Type :
conf
Filename :
6653439
Link To Document :
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