DocumentCode
2051470
Title
Measuring and simulating EMI on very small components at high frequencies
Author
Decrock, Lieven ; Catrysse, Johan ; Vanhee, F. ; Pissoort, Davy
Author_Institution
Network Solutions - DataComm, TE Connectivity, Oostkamp, Belgium
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
961
Lastpage
965
Abstract
A new test method has been implemented for testing the EMC performance of small components like small connectors and IC´s, mainly used in mobile applications. The test method is based on the EMC-stripline method. Both emission and immunity can be tested up to 6GHz, based on good RF matching conditions and with high field strengths.
Keywords
electromagnetic compatibility; electromagnetic interference; immunity testing; printed circuit testing; strip lines; EMC performance; EMC-stripline method; EMI; IC; RF matching conditions; electromagnetic emission; electromagnetic immunity; high field strengths; mobile applications; small connectors; very small components; Couplings; Electromagnetic compatibility; Electromagnetic interference; Frequency measurement; Impedance; Microstrip; Stripline; EMC; EMI-stripline; TEM-cell; small components;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location
Brugge
ISSN
2325-0356
Type
conf
Filename
6653440
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