DocumentCode
2051494
Title
Soft X-ray diffraction: an element sensitive tool to characterize patterned arrays of nanomagnets
Author
Sánchez-Hanke, C. ; Castaño, F.J. ; Hao, Y. ; Ross, C.A. ; Smith, H.I. ; Kao, C.-C.
Author_Institution
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY, USA
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we show that diffraction experiments, performed using elliptically polarized soft X-rays, can be used to characterize the structure as well as the magnetic behavior of these lithographically-defined arrays of nanomagnets.
Keywords
X-ray diffraction; cobalt; ferromagnetic materials; magnetic hysteresis; magnetic particles; nanostructured materials; Co; lithographically-defined arrays; magnetic properties; nanomagnets; Diffraction gratings; Light scattering; Magnetic field measurement; Optical polarization; Particle scattering; Resonance light scattering; X-ray detection; X-ray detectors; X-ray diffraction; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230667
Filename
1230667
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