DocumentCode :
2051590
Title :
Analysis of checksum-based execution schemes for pipelined processors
Author :
Fechner, Bernhard
Author_Institution :
Dept. of Comput. Sci., FernUniv., Hagen
fYear :
2006
fDate :
25-29 April 2006
Abstract :
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained easily but only with high additional power consumption. The electrical potential between logic `0´ and `1´ is decreased as integration and clock rates grow, leading to a higher susceptibility for transient faults, caused e.g. by power fluctuations or single event upsets (SEUs). We introduce a technique which is based on the well-known cyclic redundancy check codes (CRCs) to secure the pipelined execution of common microprocessors against transient faults. This is done by computing signatures over the control signals of each pipeline stage including dynamic out-of-order scheduling. To correctly compute the checksums, we resolve the time-dependency of instructions in the pipeline. We first discuss important physical properties of single event upsets (SEUs). Then we present a model of a simple processor with the applied scheme as an example. The scheme is extended to support n-way simultaneous multithreaded systems, resulting in two basic schemes. A cost analysis of the proposed SEU-detection schemes leads to the conclusion that both schemes are applicable at reasonable costs for pipelines with 5 to 10 stages and maximal 4 hardware threads. A worst-case simulation using software fault-injection of transient faults in the processor model showed that errors can be detected with an average of 83% even at a fault rate of 10-2. Furthermore, the scheme is able to detect an error within an average of only 5.05 cycles
Keywords :
clocks; fault tolerant computing; microcomputers; microprocessor chips; multi-threading; pipeline processing; power consumption; checksum-based execution scheme; clock rates; cyclic redundancy check codes; dynamic out-of-order scheduling; logic circuit; microprocessor; multithreaded system; pipelined processor; power consumption; power fluctuation; single event upset; software fault-injection; transient fault susceptibility; Acceleration; Clocks; Costs; Electric potential; Energy consumption; Logic; Microprocessors; Pipelines; Single event transient; Single event upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium, 2006. IPDPS 2006. 20th International
Conference_Location :
Rhodes Island
Print_ISBN :
1-4244-0054-6
Type :
conf
DOI :
10.1109/IPDPS.2006.1639664
Filename :
1639664
Link To Document :
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