DocumentCode
2051623
Title
Systematic study of double-layered ultra-thin stacked patch absorbers
Author
Herrera, Claudia ; Vandenbosch, Guy A. E.
Author_Institution
Telemic, Katholieke Univ. Leuven, Leuven, Belgium
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
998
Lastpage
1003
Abstract
We present a sensitivity study of a double-layered metamaterial absorber with two stacked patches. Two parameters of the topology are systematically tuned: the thickness of the top layer, and the size of the top patch. When parameters are tuned properly, a single-resonance-like behaviour with two resonators can be seen. Absorptions of more than 99 % can be achieved, despite the simplicity of the structure.
Keywords
electromagnetic wave absorption; metamaterials; double-layered metamaterial absorber; double-layered ultra-thin stacked patch absorbers; single-resonance-like behaviour; topology; Absorption; Bandwidth; Electromagnetic compatibility; Frequency response; Metamaterials; Reflectivity; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location
Brugge
ISSN
2325-0356
Type
conf
Filename
6653447
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