Title :
Thermal proximity sensing for hard disks
Author :
Abraham, D.W. ; Chainer, T.J. ; Etzold, K.F. ; Wickramasinghe, H.K.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we have demonstrated a new technique to detect and image defects on a disk surface using product data heads.
Keywords :
hard discs; disk surface; hard disks; image defects; product data heads; thermal proximity sensing; Equations; Hard disks; Spatial resolution;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230676
