Title :
Measurements Of Optical Damage In LiNbO3 Waveguides At 1320 nm
Author :
Betts, G.E. ; Donnell, F. J O ; Ray, K.G.
Author_Institution :
Massachusetts Institute of Technology
Keywords :
Optical buffering; Optical devices; Optical interferometry; Optical losses; Optical refraction; Optical sensors; Optical variables control; Optical waveguides; Testing; Waveguide transitions;
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN :
0-7803-0526-4
DOI :
10.1109/LEOS.1992.694152