• DocumentCode
    2051758
  • Title

    DVTS approach to digital CMOS circuits for decreasing total power consumption

  • Author

    Archanadevi, C. ; Prabhu, Vittal

  • Author_Institution
    Veltech Multitech Dr. Rangarajan Dr. Sakunthala Eng. Coll., Chennai, India
  • fYear
    2013
  • fDate
    21-22 Feb. 2013
  • Firstpage
    1203
  • Lastpage
    1208
  • Abstract
    Power consumption of Modern Digital integrated circuits increasing with each generation which becomes a serious design issue. This paper proposed a generalized power tracking algorithm that reduces power directly by dynamic control of supply voltage and body bias. The DVTS algorithm-(Dynamic Voltage and threshold scaling algorithm) save the leakage power during active mode of the circuit. Total active power can be minimized by dynamically adjusting Vdd and Vth based on circuit operating conditions such as temperature, workload, and circuit architecture. The power saving method of DVTS is similar to that of the Dynamic VDD Scaling (DVS) scheme, which adaptively changes the supply voltage depending on the current workload of the system. For a digital circuit, it is possible to trade off dynamic and sub threshold leakage power by balancing between Vdd and Vth to maintain performance.
  • Keywords
    CMOS digital integrated circuits; integrated circuit design; DVTS approach; body bias; design issue; digital CMOS circuit; digital integrated circuit; dynamic control; dynamic voltage; generalized power tracking algorithm; power reduction; power saving method; supply voltage; threshold scaling algorithm; total power consumption; Algorithm design and analysis; Clocks; Hardware; Heuristic algorithms; Power demand; Threshold voltage; Voltage control; Dynamic voltage and threshold scaling(DVTS); leakage current control; low power; power optimum point; sleep transistor; variable body bias; variable supply voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Communication and Embedded Systems (ICICES), 2013 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-5786-9
  • Type

    conf

  • DOI
    10.1109/ICICES.2013.6508248
  • Filename
    6508248