• DocumentCode
    2051763
  • Title

    A new approach to on-line turn fault detection in AC motors

  • Author

    Kliman, GB ; Premerlani, W.J. ; Koegl, R.A. ; Hoeweler, D.

  • Author_Institution
    Gen. Electr. Corp. R&D, Schenectady, NY, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    6-10 Oct 1996
  • Firstpage
    687
  • Abstract
    Turn fault detection is based on the principal that symmetrical (unfaulted) motors powered by symmetrical multiphase voltage sources will have no negative sequence currents flowing in the leads. A turn-to-turn fault will break that symmetry and give rise to a negative sequence current which may then be used as a measure of fault severity or to initiate protective action such as a circuit breaker trip. A new way of looking at the effects of turn faults has been developed that improves sensitivity and speed while reducing the probability of misdetection, taking into account voltage balance, load or voltage variation and instrument errors. The method has been implemented on a PC and tested, in real time, on a specially prepared small motor. Reliable detection of one shorted turn out of 648 turns per phase (in a Y connected motor) was demonstrated with the fault indicator becoming fully developed in two cycles of line frequency after initiation of the fault
  • Keywords
    AC motors; automatic test equipment; fault location; machine testing; machine theory; machine windings; microcomputer applications; real-time systems; AC motors; PC; circuit breaker trip; fault severity; misdetection prediction; negative sequence currents; online turn fault detection; protective action; real-time; symmetrical (unfaulted) motors; symmetrical multiphase voltage sources; AC motors; Circuit breakers; Circuit faults; Circuit testing; Current measurement; Fault detection; Instruments; Phase detection; Protection; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3544-9
  • Type

    conf

  • DOI
    10.1109/IAS.1996.557113
  • Filename
    557113