DocumentCode
2051885
Title
Re-examining the needs of the mixed-signal test community
Author
Roberts, Gordon W.
Author_Institution
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fYear
1995
fDate
21-25 Oct 1995
Firstpage
298
Abstract
The price of an increasing number of mixed-signal devices is presently being dominated by the cost of performing production testing. Probably the two most important factors affecting this cost are the direct cost of the test equipment and the time that a device-under-test (DUT) spends on that equipment. Another factor is the indirect cost incurred when test development time becomes the critical step in the manufacture of new devices. The cost of mixed-signal testers is exceedingly high on account of their requirement for both digital and analog test equipment with very high-performance capabilities. Moreover, the time the device spends on these testers can be on the order of minutes. The author discusses the problems outlined and makes some recommendations for the test community at large
Keywords
economics; integrated circuit manufacture; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; cost; design for test; development time; device-under-test; mixed-signal devices; mixed-signal test; production testing; test automation; Automatic testing; Circuit testing; Costs; Digital circuits; Manufacturing; Performance evaluation; Production; Signal processing; Tellurium; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529850
Filename
529850
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