DocumentCode :
2051885
Title :
Re-examining the needs of the mixed-signal test community
Author :
Roberts, Gordon W.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fYear :
1995
fDate :
21-25 Oct 1995
Firstpage :
298
Abstract :
The price of an increasing number of mixed-signal devices is presently being dominated by the cost of performing production testing. Probably the two most important factors affecting this cost are the direct cost of the test equipment and the time that a device-under-test (DUT) spends on that equipment. Another factor is the indirect cost incurred when test development time becomes the critical step in the manufacture of new devices. The cost of mixed-signal testers is exceedingly high on account of their requirement for both digital and analog test equipment with very high-performance capabilities. Moreover, the time the device spends on these testers can be on the order of minutes. The author discusses the problems outlined and makes some recommendations for the test community at large
Keywords :
economics; integrated circuit manufacture; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; cost; design for test; development time; device-under-test; mixed-signal devices; mixed-signal test; production testing; test automation; Automatic testing; Circuit testing; Costs; Digital circuits; Manufacturing; Performance evaluation; Production; Signal processing; Tellurium; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2992-9
Type :
conf
DOI :
10.1109/TEST.1995.529850
Filename :
529850
Link To Document :
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