• DocumentCode
    2051885
  • Title

    Re-examining the needs of the mixed-signal test community

  • Author

    Roberts, Gordon W.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    298
  • Abstract
    The price of an increasing number of mixed-signal devices is presently being dominated by the cost of performing production testing. Probably the two most important factors affecting this cost are the direct cost of the test equipment and the time that a device-under-test (DUT) spends on that equipment. Another factor is the indirect cost incurred when test development time becomes the critical step in the manufacture of new devices. The cost of mixed-signal testers is exceedingly high on account of their requirement for both digital and analog test equipment with very high-performance capabilities. Moreover, the time the device spends on these testers can be on the order of minutes. The author discusses the problems outlined and makes some recommendations for the test community at large
  • Keywords
    economics; integrated circuit manufacture; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; cost; design for test; development time; device-under-test; mixed-signal devices; mixed-signal test; production testing; test automation; Automatic testing; Circuit testing; Costs; Digital circuits; Manufacturing; Performance evaluation; Production; Signal processing; Tellurium; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529850
  • Filename
    529850