Title :
Sensor network devolution and breakdown in survivor connectivity
Author :
Kunniyur, Srisankar S. ; Venkatesh, Santosh S.
Author_Institution :
Dept. of Electr. & Syst. Eng., Pennsylvania Univ., Philadelphia, PA, USA
fDate :
27 June-2 July 2004
Abstract :
As batteries fail in wireless sensor networks there is an inevitable devolution of the network characterised by a breakdown in connectivity between the surviving nodes of the network. A sharp limit theorem characterising the time at which this phenomena makes an appearance is derived.
Keywords :
wireless sensor networks; battery fail; sharp limit theorem; surviving node network; survivor connectivity breakdown; wireless sensor network devolution; Batteries; Degradation; Electric breakdown; Intelligent networks; Power system modeling; Random variables; Sensor phenomena and characterization; Sensor systems; Systems engineering and theory; Wireless sensor networks;
Conference_Titel :
Information Theory, 2004. ISIT 2004. Proceedings. International Symposium on
Print_ISBN :
0-7803-8280-3
DOI :
10.1109/ISIT.2004.1365118
