• DocumentCode
    2051925
  • Title

    Sensor network devolution and breakdown in survivor connectivity

  • Author

    Kunniyur, Srisankar S. ; Venkatesh, Santosh S.

  • Author_Institution
    Dept. of Electr. & Syst. Eng., Pennsylvania Univ., Philadelphia, PA, USA
  • fYear
    2004
  • fDate
    27 June-2 July 2004
  • Firstpage
    82
  • Abstract
    As batteries fail in wireless sensor networks there is an inevitable devolution of the network characterised by a breakdown in connectivity between the surviving nodes of the network. A sharp limit theorem characterising the time at which this phenomena makes an appearance is derived.
  • Keywords
    wireless sensor networks; battery fail; sharp limit theorem; surviving node network; survivor connectivity breakdown; wireless sensor network devolution; Batteries; Degradation; Electric breakdown; Intelligent networks; Power system modeling; Random variables; Sensor phenomena and characterization; Sensor systems; Systems engineering and theory; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2004. ISIT 2004. Proceedings. International Symposium on
  • Print_ISBN
    0-7803-8280-3
  • Type

    conf

  • DOI
    10.1109/ISIT.2004.1365118
  • Filename
    1365118