• DocumentCode
    2051979
  • Title

    Detecting Attempts at Humor in Multiparty Meetings

  • Author

    Laskowski, Kornel

  • Author_Institution
    Language Technol. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2009
  • fDate
    14-16 Sept. 2009
  • Firstpage
    9
  • Lastpage
    16
  • Abstract
    Systems designed for the automatic summarization of meetings have considered the propositional content of contributions by each speaker, but not the explicit techniques that speakers use to downgrade the perceived seriousness of those contributions. We analyze one such technique, namely attempts at humor. We find that speech spent on attempts at humor is rare by time but that it correlates strongly with laughter, which is more frequent. Contextual features describing the temporal and multiparticipant distribution of manually transcribed laughter yield error rates for the detection of attempts at humor which are 4 times lower than those obtained using oracle lexical information. Furthermore, we show that similar performance can be achieved by considering only the speaker´s laughter, indicating that meeting participants explicitly signal their attempts at humor by laughing themselves. Finally, we present evidence which suggests that, on small time scales, the production of attempts at humor and their ratification via laughter often involves only two participants, belying the allegedly multiparty nature of the interaction.
  • Keywords
    computational linguistics; language translation; manually transcribed laughter; meetings automatic summarization; multiparticipant distribution; multiparty conversation; multiparty meetings; oracle lexical information; temporal distribution; Acoustic measurements; Acoustic signal detection; Collaborative work; Error analysis; Humans; Meetings; Natural languages; Production; Speech; USA Councils; conversation; humor; laughter; meetings; modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semantic Computing, 2009. ICSC '09. IEEE International Conference on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    978-1-4244-4962-0
  • Electronic_ISBN
    978-0-7695-3800-6
  • Type

    conf

  • DOI
    10.1109/ICSC.2009.81
  • Filename
    5298515