DocumentCode :
2051998
Title :
Flip chip repair process
Author :
Basavanhally, N.R. ; Gahr, S.A. ; Liu, J.J. ; Nguyen, H.N.
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
779
Lastpage :
782
Abstract :
A fluxless repair process for flip-chip multichip modules (MCMs) is demonstrated. The process includes steps for removing defective chips, reducing and leveling solder at the chip site, and retacking a new, good chip in its place. After chip removal, most of solder remained on the bonding pads. A technique has been developed to remove excess solder and to level the pads to a consistent bump height. Experimentation has shown that the wick chip reduced remaining solder bump heights to about the same height as the virgin substrate. New chips were then retacked to the leveled sites and the modules were heated in a controlled atmosphere to reflow the solder joints. Modules repaired using this technique have shown yields similar to those obtained during the initial assembly stages in electrical continuity tests
Keywords :
flip-chip devices; integrated circuit technology; microassembling; modules; soldering; assembly; excess solder removal; flip-chip multichip modules; fluxless repair process; hybrid IC; repair process; solder joint reflow; Bonding; Cameras; Environmental economics; Flip chip; Packaging; Robot vision systems; Robotic assembly; Silicon; Soldering; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163968
Filename :
163968
Link To Document :
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