• DocumentCode
    2051998
  • Title

    Flip chip repair process

  • Author

    Basavanhally, N.R. ; Gahr, S.A. ; Liu, J.J. ; Nguyen, H.N.

  • Author_Institution
    AT&T Bell Labs., Princeton, NJ, USA
  • fYear
    1991
  • fDate
    11-16 May 1991
  • Firstpage
    779
  • Lastpage
    782
  • Abstract
    A fluxless repair process for flip-chip multichip modules (MCMs) is demonstrated. The process includes steps for removing defective chips, reducing and leveling solder at the chip site, and retacking a new, good chip in its place. After chip removal, most of solder remained on the bonding pads. A technique has been developed to remove excess solder and to level the pads to a consistent bump height. Experimentation has shown that the wick chip reduced remaining solder bump heights to about the same height as the virgin substrate. New chips were then retacked to the leveled sites and the modules were heated in a controlled atmosphere to reflow the solder joints. Modules repaired using this technique have shown yields similar to those obtained during the initial assembly stages in electrical continuity tests
  • Keywords
    flip-chip devices; integrated circuit technology; microassembling; modules; soldering; assembly; excess solder removal; flip-chip multichip modules; fluxless repair process; hybrid IC; repair process; solder joint reflow; Bonding; Cameras; Environmental economics; Flip chip; Packaging; Robot vision systems; Robotic assembly; Silicon; Soldering; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1991. Proceedings., 41st
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-0012-2
  • Type

    conf

  • DOI
    10.1109/ECTC.1991.163968
  • Filename
    163968