DocumentCode
2051998
Title
Flip chip repair process
Author
Basavanhally, N.R. ; Gahr, S.A. ; Liu, J.J. ; Nguyen, H.N.
Author_Institution
AT&T Bell Labs., Princeton, NJ, USA
fYear
1991
fDate
11-16 May 1991
Firstpage
779
Lastpage
782
Abstract
A fluxless repair process for flip-chip multichip modules (MCMs) is demonstrated. The process includes steps for removing defective chips, reducing and leveling solder at the chip site, and retacking a new, good chip in its place. After chip removal, most of solder remained on the bonding pads. A technique has been developed to remove excess solder and to level the pads to a consistent bump height. Experimentation has shown that the wick chip reduced remaining solder bump heights to about the same height as the virgin substrate. New chips were then retacked to the leveled sites and the modules were heated in a controlled atmosphere to reflow the solder joints. Modules repaired using this technique have shown yields similar to those obtained during the initial assembly stages in electrical continuity tests
Keywords
flip-chip devices; integrated circuit technology; microassembling; modules; soldering; assembly; excess solder removal; flip-chip multichip modules; fluxless repair process; hybrid IC; repair process; solder joint reflow; Bonding; Cameras; Environmental economics; Flip chip; Packaging; Robot vision systems; Robotic assembly; Silicon; Soldering; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-0012-2
Type
conf
DOI
10.1109/ECTC.1991.163968
Filename
163968
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