• DocumentCode
    2052011
  • Title

    SAT-based code synthesis for fault-secure circuits

  • Author

    Dalirsani, Atefe ; Kochte, Michael A. ; Wunderlich, H.-J.

  • Author_Institution
    ITI, Univ. Stuttgart, Stuttgart, Germany
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    39
  • Lastpage
    44
  • Abstract
    This paper presents a novel method for synthesizing fault-secure circuits based on parity codes over groups of circuit outputs. The fault-secure circuit is able to detect all errors resulting from combinational and transition faults at a single node. The original circuit is not modified. If the original circuit is non-redundant, the result is a totally self-checking circuit. At first, the method creates the minimum number of parity groups such that the effect of each fault is not masked in at least one parity group. To ensure fault-secureness, the obtained groups are split such that no fault leads to silent data corruption. This is performed by a formal Boolean satisfiability (SAT) based analysis. Since the proposed method reduces the number of required parity groups, the number of two-rail checkers and the complexity of the prediction logic required for fault-secureness decreases as well. Experimental results show that the area overhead is much less compared to duplication and less in comparison to previous methods for synthesis of totally self-checking circuits. Since the original circuit is not modified, the method can be applied for fixed hard macros and IP cores.
  • Keywords
    computability; IP cores; SAT based code synthesis; circuit outputs; fault secure circuits; fault secureness; formal Boolean satisfiability SAT based analysis; nonredundant; parity codes; parity groups; prediction logic; self-checking circuits; silent data corruption; two-rail checkers; Runtime; Concurrent error detection (CED); error control coding; self-checking circuit; totally self-checking (TSC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653580
  • Filename
    6653580