DocumentCode :
2052011
Title :
SAT-based code synthesis for fault-secure circuits
Author :
Dalirsani, Atefe ; Kochte, Michael A. ; Wunderlich, H.-J.
Author_Institution :
ITI, Univ. Stuttgart, Stuttgart, Germany
fYear :
2013
fDate :
2-4 Oct. 2013
Firstpage :
39
Lastpage :
44
Abstract :
This paper presents a novel method for synthesizing fault-secure circuits based on parity codes over groups of circuit outputs. The fault-secure circuit is able to detect all errors resulting from combinational and transition faults at a single node. The original circuit is not modified. If the original circuit is non-redundant, the result is a totally self-checking circuit. At first, the method creates the minimum number of parity groups such that the effect of each fault is not masked in at least one parity group. To ensure fault-secureness, the obtained groups are split such that no fault leads to silent data corruption. This is performed by a formal Boolean satisfiability (SAT) based analysis. Since the proposed method reduces the number of required parity groups, the number of two-rail checkers and the complexity of the prediction logic required for fault-secureness decreases as well. Experimental results show that the area overhead is much less compared to duplication and less in comparison to previous methods for synthesis of totally self-checking circuits. Since the original circuit is not modified, the method can be applied for fixed hard macros and IP cores.
Keywords :
computability; IP cores; SAT based code synthesis; circuit outputs; fault secure circuits; fault secureness; formal Boolean satisfiability SAT based analysis; nonredundant; parity codes; parity groups; prediction logic; self-checking circuits; silent data corruption; two-rail checkers; Runtime; Concurrent error detection (CED); error control coding; self-checking circuit; totally self-checking (TSC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
ISSN :
1550-5774
Print_ISBN :
978-1-4799-1583-5
Type :
conf
DOI :
10.1109/DFT.2013.6653580
Filename :
6653580
Link To Document :
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