• DocumentCode
    2052047
  • Title

    DaemonGuard: O/S-assisted selective software-based Self-Testing for multi-core systems

  • Author

    Skitsas, Michael A. ; Nicopoulos, Chrysostomos A. ; Michael, Maria K.

  • Author_Institution
    Dept. of ECE, Univ. of Cyprus, Nicosia, Cyprus
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    45
  • Lastpage
    51
  • Abstract
    As technology scales deep into the sub-micron regime, transistors become less reliable. Future systems are widely predicted to suffer from considerable aging and wear-out effects. This ominous threat has urged system designers to develop effective run-time testing methodologies that can monitor and assess the system´s health. In this work, we investigate the potential of online software-based functional testing at the granularity of individual microprocessor core components in multi-core systems. While existing techniques monolithically test the entire core, our approach aims to reduce testing time by avoiding the over-testing of under-utilized units. To facilitate fine-grained testing, we introduce DaemonGuard, a framework that enables the real-time observation of individual sub-core modules and performs on-demand selective testing of only the modules that have recently been stressed. The monitoring and test-initiation process is orchestrated by a transparent, minimally-intrusive, and lightweight operating system process that observes the utilization of individual datapath components at run-time. We perform a series of experiments using a full-system, execution-driven simulation framework running a commodity operating system, real multi-threaded workloads, and test programs. Our results indicate that operating-system-assisted selective testing at the sub-core level leads to substantial savings in testing time and very low impact on system performance.
  • Keywords
    automatic test software; built-in self test; multiprocessing systems; operating systems (computers); DaemonGuard; OS plug-in; multicore microprocessors; multicore systems; operating-system-assisted selective testing; selective testing; software based self-testing; sub-core level; submicron regime; test daemon; testing manager; Benchmark testing; Hardware; Multicore processing; Operating systems; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653581
  • Filename
    6653581