• DocumentCode
    2052166
  • Title

    Fault Injection Framework for embedded memories

  • Author

    Skoncej, Patryk

  • Author_Institution
    IHP, Frankfurt (Oder), Germany
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    Due to scalability issues of existing semiconductor memories emerging non-volatile memory technologies are gaining increasing interest. Their promising features like non-volatility, low-power consumption, and great scalability are expected to meet demands of upcoming digital systems. Unfortunately, due to their characteristics they often require special management. Moreover, due to certain properties, e.g. like limited endurance, their applicability in some cases can be restricted. As a result, selection of a non-volatile technology appropriate for a target system can be difficult. This paper proposes an approach which facilitates a design process of a system incorporating non-volatile memories. It presents a tool which generates non-volatile memory model which can be used not only in system´s simulations but also in emulations in hardware.
  • Keywords
    embedded systems; fault diagnosis; random-access storage; semiconductor device models; semiconductor device testing; semiconductor storage; design process; embedded memories; fault injection framework; nonvolatile memory model; nonvolatile memory technologies; scalability issues; semiconductor memories; system simulations; Computer aided manufacturing; Data models; Emulation; Hardware design languages; Memory management; Nonvolatile memory; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653586
  • Filename
    6653586