DocumentCode
2052353
Title
The Modeling of Radioisotope Micro Batteries for Microsystems
Author
Sun, Lei ; Yuan, Wei Z. ; Qiao, Da Y.
Author_Institution
Micro & Nano Electromech. Syst. Lab., Northwestern Polytech. Univ., Xi´´an
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
178
Lastpage
181
Abstract
Conventional direct conversion devices of radioisotope micro battery (RMB) suffer from small surface area and unreliability. In order to solve these problems, a method, which is verified with simulation results, is introduced for modeling the direct conversion devices. The fundamental structure of RMB is presented, and the equations of current are founded. The novel direct conversion device of vertical wall array is demonstrated. As a result, 171% increase of the surface area is acquired and the reliability is enhanced owing to the electro plating section. Simulation is performed to investigate the performance of RMB with the source density of 1mCi/mm2. Optimization of the method has resulted in that the optimum doping concentrations are NA=1017/cm3 and ND=1017 /cm3. Simulation results predicts that the method based the novel direct conversion device can get a VOC (open circuit voltage) of 180mV, a JSC (short circuit current density) of 3nA/mm2 and Pm (output power density) of 0.4nW/mm2 within a volume of 0.1mm3
Keywords
cells (electric); doping; electroplating; micromechanical devices; radioactive sources; radioisotopes; reliability; RMB structure; direct conversion devices; electroplating section; microsystems; open circuit voltage; optimization; optimum doping concentrations; radioisotope micro battery modeling; surface area increase; unreliability; vertical wall array; Batteries; Circuit simulation; Doping; Equations; Optimization methods; Power generation; Predictive models; Radioactive materials; Short circuit currents; Voltage; Radioisotope Micro Battery; direct conversion devices; electro plating section; vertical wall array;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334664
Filename
4134929
Link To Document