Title :
Interferometric Synthetic Aperture Microscopy: Physics-Based Image Reconstruction from Optical Coherence Tomography Data
Author :
Davis, Brynmor J. ; Ralston, Tyler S. ; Marks, Daniel L. ; Boppart, Stephen A. ; Carney, P. Scott
Author_Institution :
Beckman Inst. for Adv. Sci. & Technol., Urbana
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
Optical coherence tomography (OCT) is an optical ranging technique analogous to radar - detection of back-scattered light produces a signal that is temporally localized at times-of-flight corresponding to the location of scatterers in the object. However the interferometric collection technique used in OCT allows, in principle, the coherent collection of data, i.e. amplitude and phase information can be extracted. Interferometric synthetic aperture microscopy (ISAM) adds phase-stable data collection to OCT instrumentation and employs physics-based processing analogous to that used in synthetic aperture radar (SAR). That is, the complex nature of the coherent data is exploited to give gains in image quality. Specifically, diffraction-limited resolution is achieved throughout the sample, not just within focal volume of the illuminating field. Simulated and experimental verifications of this effect are presented. ISAM´s computational focusing obviates the trade-off between lateral resolution and depth-of-focus seen in traditional OCT.
Keywords :
image reconstruction; light interferometry; optical images; optical tomography; OCT instrumentation; back-scattered light detection; diffraction-limited resolution; interferometric synthetic aperture microscopy; optical coherence tomography data; optical ranging technique; phase-stable data collection; physics-based image reconstruction; Adaptive optics; Image reconstruction; Laser radar; Optical interferometry; Optical microscopy; Optical scattering; Radar detection; Radar imaging; Radar scattering; Tomography; Image Reconstruction; Inverse Problems; Microscopy; Optical Interferometry; Optical Tomography;
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2007.4379975