DocumentCode
2052368
Title
Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling
Author
Kleeberger, Veit B. ; Mueller-Gritschneder, D. ; Schlichtmann, Ulf
Author_Institution
Inst. for Electron. Design Autom., Tech. Univ. Munchen, Munich, Germany
fYear
2013
fDate
2-4 Oct. 2013
Firstpage
118
Lastpage
124
Abstract
This paper proposes a fault injection method for the accurate prediction of failure rates of embedded applications. The presented approach relies on Mixture Importance Sampling. Hence, it is very efficient and requires far fewer samples than standard Monte Carlo. We utilize the presented injection method to link a technology-aware fault model for cache soft errors to a system-level simulation. This cross-layer approach is demonstrated to analyze the fault tolerance of an autonomous robot. The presented approach is a step towards designing fault tolerant embedded systems with reduced protection mechanisms to save power and area, as this requires efficient methods to predict system failure rates.
Keywords
failure analysis; importance sampling; radiation hardening (electronics); robots; autonomous robot; cross-layer approach; embedded systems; fault injection method; fault tolerance; mixture importance sampling; protection mechanisms; soft errors; system-level simulation; technology-aware system failure analysis; Circuit faults; Estimation; Monte Carlo methods; Neutrons; Reliability; Robots; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location
New York City, NY
ISSN
1550-5774
Print_ISBN
978-1-4799-1583-5
Type
conf
DOI
10.1109/DFT.2013.6653593
Filename
6653593
Link To Document