Title :
Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling
Author :
Kleeberger, Veit B. ; Mueller-Gritschneder, D. ; Schlichtmann, Ulf
Author_Institution :
Inst. for Electron. Design Autom., Tech. Univ. Munchen, Munich, Germany
Abstract :
This paper proposes a fault injection method for the accurate prediction of failure rates of embedded applications. The presented approach relies on Mixture Importance Sampling. Hence, it is very efficient and requires far fewer samples than standard Monte Carlo. We utilize the presented injection method to link a technology-aware fault model for cache soft errors to a system-level simulation. This cross-layer approach is demonstrated to analyze the fault tolerance of an autonomous robot. The presented approach is a step towards designing fault tolerant embedded systems with reduced protection mechanisms to save power and area, as this requires efficient methods to predict system failure rates.
Keywords :
failure analysis; importance sampling; radiation hardening (electronics); robots; autonomous robot; cross-layer approach; embedded systems; fault injection method; fault tolerance; mixture importance sampling; protection mechanisms; soft errors; system-level simulation; technology-aware system failure analysis; Circuit faults; Estimation; Monte Carlo methods; Neutrons; Reliability; Robots; Shape;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
Print_ISBN :
978-1-4799-1583-5
DOI :
10.1109/DFT.2013.6653593