• DocumentCode
    2052368
  • Title

    Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling

  • Author

    Kleeberger, Veit B. ; Mueller-Gritschneder, D. ; Schlichtmann, Ulf

  • Author_Institution
    Inst. for Electron. Design Autom., Tech. Univ. Munchen, Munich, Germany
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    118
  • Lastpage
    124
  • Abstract
    This paper proposes a fault injection method for the accurate prediction of failure rates of embedded applications. The presented approach relies on Mixture Importance Sampling. Hence, it is very efficient and requires far fewer samples than standard Monte Carlo. We utilize the presented injection method to link a technology-aware fault model for cache soft errors to a system-level simulation. This cross-layer approach is demonstrated to analyze the fault tolerance of an autonomous robot. The presented approach is a step towards designing fault tolerant embedded systems with reduced protection mechanisms to save power and area, as this requires efficient methods to predict system failure rates.
  • Keywords
    failure analysis; importance sampling; radiation hardening (electronics); robots; autonomous robot; cross-layer approach; embedded systems; fault injection method; fault tolerance; mixture importance sampling; protection mechanisms; soft errors; system-level simulation; technology-aware system failure analysis; Circuit faults; Estimation; Monte Carlo methods; Neutrons; Reliability; Robots; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653593
  • Filename
    6653593