DocumentCode
2052409
Title
Spatio-Temporal Defect Pixel Interpolation using 3-D Frequency Selective Extrapolation
Author
Meisinger, Katrin ; Aach, Til ; Kaup, André
Author_Institution
Univ. Erlangen-Nuremberg, Erlangen
Volume
4
fYear
2007
fDate
Sept. 16 2007-Oct. 19 2007
Abstract
Flat panel X-ray detectors allow the immediate availability of the acquired images for display. However, they provide images with defective areas amongst others due to manufacturing problems. In this contribution, we present a frequency selective extrapolation method in order to restore these defects by extending the surrounding signal into the defective area. In case of static radiographs, the spatial surrounding is evaluated by a 2-D approach. Defects in sequences acquired by cine-angiography or fluoroscopy are processed by 3-D extrapolation. The defects are replaced by extrapolating the signal from the spatial and at the same time temporal surrounding, taking previous and subsequent frames into account. Hence, inherent motion compensation is accomplished. The application of the spatial and where applicable spatio-temporal extrapolation approach allows to restore smooth areas, edges, patterns as well as noise. The ability to restore noise is especially important for medical images because it leads to a natural appearance of the concealed defective areas.
Keywords
X-ray detection; diagnostic radiography; medical image processing; motion compensation; 3D frequency selective extrapolation; cine-angiography; flat panel X-ray detectors; fluoroscopy; inherent motion compensation; manufacturing problems; medical images; spatio-temporal defect pixel interpolation; spatio-temporal extrapolation; static radiographs; temporal surrounding; Extrapolation; Flat panel displays; Frequency; Image restoration; Interpolation; Manufacturing; Motion compensation; Radiography; Signal restoration; X-ray detectors; Signal extrapolation; defect interpolation; medical imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location
San Antonio, TX
ISSN
1522-4880
Print_ISBN
978-1-4244-1437-6
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2007.4379976
Filename
4379976
Link To Document