Title :
On-state reliability of solid-electrolyte switch
Author :
Banno, N. ; Sakamoto, T. ; Fujieda, S. ; Aono, M.
Author_Institution :
Device Platforms Res. Labs., NEC Corp., Sagamihara
fDate :
April 27 2008-May 1 2008
Abstract :
We examined the ON-state reliability of a solid electrolyte resistive switch,named ldquoNanoBridgerdquo, for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of ~0.2 mA at 105degC for 10 years and low turn-off current less than 5 mA. NanoBridge can thus meet the requirements for programmable logic applications.
Keywords :
copper; copper compounds; durability; microswitches; nanoelectronics; platinum; programmable logic devices; reliability; solid electrolytes; tantalum compounds; Cu-Cu2S-Pt; Cu-Ta2O5-Pt; ON conductance; ON-state reliability; durability; nanobridge; programmable logic application; solid electrolyte resistive switch; temperature 105 degC; time 10 year; turn-off current; Circuits; Current measurement; Electrodes; Materials reliability; Nanoscale devices; Programmable logic arrays; Programmable logic devices; Solids; Switches; Voltage;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4558999
