Title :
Differential analysis of Round-Reduced AES faulty ciphertexts
Author :
Mirbaha, Amir-Pasha ; Dutertre, J.-M. ; Tria, Assia
Author_Institution :
Secure Syst. & Archit. (SAS) Dept., Ecole Nat. Super. des Mines de St.- Etienne, Gardanne, France
Abstract :
This paper describes new Round Reduction analysis attacks on an Advanced Encryption Standard (AES) implementation by laser fault injection. The previous round reduction attacks require both of spatial and temporal accuracies in order to execute only one, two or nine rounds. We present new attacks by more flexible fault injection conditions. Our experiments are carried out on an 8-bit microcontroller which embeds a software AES with pre-calculated round keys. Faults are injected either into the round counter itself or into the reference of its total round number. The attacks may result to the use of a faulty round key at the last one or two executed rounds. The cryptanalysis of the obtained round-reduced faulty ciphertexts resorts to the differentiation techniques used by Differential Fault Analysis.
Keywords :
cryptography; fault diagnosis; microcontrollers; advanced encryption standard; cryptanalysis; differential fault analysis; differentiation techniques; laser fault injection; microcontroller; pre-calculated round keys; round reduction analysis; round-reduced AES faulty ciphertexts; word length 8 bit; Algorithm design and analysis; Encryption; Indexes; Radiation detectors; Software; Software algorithms;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
Print_ISBN :
978-1-4799-1583-5
DOI :
10.1109/DFT.2013.6653607