• DocumentCode
    2052736
  • Title

    Charge sharing aware NCL gates design

  • Author

    Moreira, Matheus T. ; Oliveira, Bruno S. ; Moraes, Fernando G. ; Calazans, Ney L. V.

  • Author_Institution
    GAPH - Fac. of Comput. Sci., PUCRS, Porto Alegre, Brazil
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    212
  • Lastpage
    217
  • Abstract
    Interest in asynchronous circuits has increased in the VLSI research community due the growing limitations faced during the design of synchronous circuits, which often result in over constrained design and operation. For designing asynchronous circuits quasi-delay-insensitive approaches are often preferable due to their simple timing analysis and closure. Null Convention Logic (NCL) is a style that supports quasi-delay-insensitive design and enables power-, area- and speed-efficient circuits using a standard-cell methodology. However, the correct functionality of such circuits can be jeopardized by glitches caused by charge sharing effects, which can generate single event upsets. This work scrutinizes the electrical behavior of NCL gates and proposes design optimizations that improve their robustness to charge sharing glitches. Experimental results suggest that the proposed optimizations lead to more robust implementations, increasing fault avoidance and reliability in such circuits.
  • Keywords
    VLSI; asynchronous circuits; fault tolerance; integrated circuit reliability; logic design; logic gates; VLSI research community; area-efficient circuit; asynchronous circuit design; asynchronous circuits; charge sharing aware NCL gates design; charge sharing effects; charge sharing glitches; design optimizations; electrical behavior; fault avoidance; null convention logic; over constrained design; power-efficient circuit; quasidelay-insensitive design; reliability; single event upsets; speed-efficient circuit; standard-cell methodology; timing analysis; CMOS integrated circuits; Capacitance; Logic gates; Optimization; Robustness; Switches; Transistors; charge sharing; null convention logic; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653608
  • Filename
    6653608