DocumentCode
2052873
Title
Thernally Driven Miniature Electric Field Sensor
Author
Chen, Xianxiang ; Peng, Chunrong ; Ye, Chao ; Tao, Hu ; Bai, Qiang ; Chen, Shaofeng ; Xia, Shanhong
Author_Institution
State Key Lab. of Transducer Technol., Chinese Acad. of Sci., Beijing
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
258
Lastpage
261
Abstract
A thermally driven miniature electric field sensor (MEFS) has been designed, fabricated and tested. It is mainly comprised of shielding electrodes, bent beam thermal driver, positive and negative sense electrodes and drive pads etc, the shielding electrodes are driven by a cascaded bent beam thermal driver to periodically cover or expose the positive and negative sense electrodes. The thermally driven MEFS has the advantage of small size, light weight, low driving voltage, easy to integrate with circuits, low drive-signal cross talk noise etc. When activated with a square wave of plusmn2 V amplitude at a frequency of 20 kHz, the electric field strength resolution of the thermally driven MEFS can reach 105.8 V/m when the electric field strength is over 20000 V/m, but its output sensitivity will decrease when the electric field strength goes down from 20000 V/m. We will improve the low electric field sensitivity in our future work
Keywords
electric sensing devices; electrodes; microsensors; 20 kHz; cascaded bent beam thermal driver; circuit integration; drive pads; electric field strength resolution; low drive-signal cross talk noise; low driving voltage; miniature electric field sensor; negative sense electrodes; output sensitivity; positive sense electrodes; shielding electrodes; square wave activation; thermally driven MEFS design; thermally driven MEFS fabrication; thermally driven MEFS testing; Driver circuits; Electric fields; Electrodes; Electrostatics; Frequency; Mechanical sensors; Micromechanical devices; Milling machines; Thermal sensors; Voltage; MEMS; electric field sensor; thermal driver;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334699
Filename
4134947
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