• DocumentCode
    2052914
  • Title

    Spare sharing network enhancement for scalable systems

  • Author

    Khaleghi, S. ; Wenjing Rao

  • Author_Institution
    ECE Dept., Univ. of Illinois at Chicago, Chicago, IL, USA
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    Future systems based on nano-scale devices will provide great potentials for scaling up in system complexity, yet at the same time be highly susceptible to operational faults. While spare units can be used to enhance reliability through the repair-based approaches, redundancy is most effectively utilized if any spare unit can be used to replace any faulty unit. However, such a scheme demands a fully connected network of spare sharing, and will be dreadfully expensive when system size and complexity scale up. In this paper, we focus on scalable systems with spare units shared under interconnect constraints in a limited way. Particularly, we propose an approach to add a small number of connections in the “spare sharing network” to boost system reliability. The proposed methodology identifies and connects the vulnerable units to the exploitable spares, thus strengthening the entire system at low cost. Simulation results confirm that the proposed methodology boosts reliability at the small cost of a few additional interconnections.
  • Keywords
    fault diagnosis; integrated circuit interconnections; integrated circuit reliability; nanoelectronics; redundancy; entire system; faulty unit; fully connected network; interconnect constraints; nanoscale devices; operational faults; redundancy; repair-based approaches; scalable systems; spare sharing network enhancement; spare units; system complexity; system reliability; vulnerable units; Bipartite graph; Fault tolerant systems; Maintenance engineering; Redundancy; Structural rings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653614
  • Filename
    6653614