Title :
Modeling and analysis of repair and maintenance processes in Fault Tolerant Systems
Author :
Hung, J.-Y. ; Park, N.-J. ; George, K.M. ; Park, Nahea
Author_Institution :
Dept. of Comput. Sci., Oklahoma City Univ., Oklahoma City, OK, USA
Abstract :
This paper proposes a new model to evaluate the reliability, as a metric of the quality of fault tolerant systems that undergo repair and maintenance processes. The model is developed based on the markovian nature of repair and maintenance processes. The repair and maintenance processes are characterized with respect to mean time between failure, mean time between repair and mean time between maintenance. Simulation results are shown to demonstrate various co-effects of repair and maintenance processes on the reliability under the assumption of the proposed model.
Keywords :
Markov processes; fault tolerance; maintenance engineering; reliability theory; Markovian nature; failure; fault tolerant systems; maintenance processes; mean time; reliability; repair processes; Maintenance engineering; Market research; Power system reliability; Random access memory; Reliability engineering; Steady-state;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
Print_ISBN :
978-1-4799-1583-5
DOI :
10.1109/DFT.2013.6653616