Title :
Exploiting error control approaches for Hardware Trojans on Network-on-Chip links
Author :
Qiaoyan Yu ; Frey, Jesse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Hampshire, Durham, NH, USA
Abstract :
We exploit transient and permanent error control methods to address Hardware Trojan (HT) issues in Network-on-Chip (NoC) links. The use of hardware-efficient error control methods on NoC links has the potential to reduce the overall hardware cost for security protection, with respect to cryptographic-based rerouting algorithms. An error control coding method for transient errors is used to detect the HT-induced link errors. Regarding the faulty links as permanently failed interconnects, we propose to reshuffle the links and isolate the HT-controlled link wires. Rather than rerouting packets via alternative paths, the proposed method resumes the utilization of partially failed links to improve the bandwidth and the average latency of NoCs. Simulation results show that our method improves the average latency by up to 44.7% over the rerouting approach. The reduction on latency varies from 20% to 41% for three traffic patterns on a 5×5 mesh NoC. The impact of different HT locations on NoC links was examined, as well. Our method is not sensitive to HT locations and can improve the effective bandwidth by up to 29 bits per cycle with minor overhead.
Keywords :
cryptography; invasive software; network-on-chip; HT-controlled link wires; HT-induced link errors; NoC links; average latency reduction; cryptographic-based rerouting algorithms; error control coding method; faulty links; hardware Trojan; hardware cost reduction; hardware-efficient error control methods; links reshuffle; network-on-chip links; permanent error control methods; rerouting approach; security protection; traffic patterns; transient error control methods; Cryptography; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Hardware; Trojan horses; Hardware Trojan; chip security; cryptographic algorithm; error control; network-on-chip (NoC);
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
Print_ISBN :
978-1-4799-1583-5
DOI :
10.1109/DFT.2013.6653617