DocumentCode
2052984
Title
Biographies
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
747
Lastpage
786
Abstract
Contains an entry for each author and co-author included in this issue of the publication.
Keywords
Biographies; CMOS technology; Circuit simulation; Electrical engineering; Integrated circuit technology; Materials science and technology; Physics; Radiation effects; Reliability engineering; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location
Phoenix, AZ
Print_ISBN
978-1-4244-2049-0
Type
conf
DOI
10.1109/RELPHY.2008.4559019
Filename
4559019
Link To Document