Beyond the byzantine generals: unexpected behavior and bridging fault diagnosis

Author

Lavo, David B. ; Larrabee, Tracy ; Chess, Brian

Author_Institution

Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA

fYear

1996

fDate

20-25 Oct 1996

Firstpage

611

Lastpage

619

Abstract

Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates predictive diagnosis. This paper reports on a diagnosis procedure that uses modified composite signatures constructed from single stuck-at information combined with a lexicographic matching and ranking algorithm. The diagnosis procedure is used to perform high-quality bridging fault diagnosis for more than 400,000 diagnostic experiments involving dropping or adding behaviors from the simulations of faulty circuits

Keywords

CMOS digital integrated circuits; circuit analysis computing; failure analysis; fault diagnosis; integrated circuit testing; logic testing; CMOS ICs; adding behavior; bridging fault diagnosis; diagnostic experiments; dropping behavior; faulty circuit simulations; lexicographic matching; modified composite signatures; physical defects; predictive diagnosis; ranking algorithm; single stuck-at information; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Failure analysis; Fault diagnosis; Physics computing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.557118

Filename

557118