• DocumentCode
    2052992
  • Title

    A smart Trojan circuit and smart attack method in AES encryption circuits

  • Author

    Yoshimura, Masashi ; Ogita, Amy ; Hosokawa, T.

  • Author_Institution
    Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    278
  • Lastpage
    283
  • Abstract
    The increased utilization of outsourcing services for designing and manufacturing LSIs can reduce the reliability of LSIs. Trojan circuits are malicious circuits that can leak secret information. In this paper, we propose a Trojan circuit whose detection is difficult in AES circuits. To make it difficult to detect the proposed Trojan circuit, we propose two methods. In one method, one of test mode signal lines not used in normal operation is included in the activation conditions on the trigger unit. In the other, the payload unit does not directly leak the cipher key of an AES circuit but instead leaks information related to the cipher key. We also propose a procedure to obtain the secret key from the information. We demonstrate that it is difficult to detect the proposed Trojan circuit by using existing approaches. We show results to implement and to estimate the area and power of AES circuits with and without the proposed Trojan circuit.
  • Keywords
    cryptography; fault diagnosis; integrated circuit design; integrated circuit reliability; integrated circuit testing; invasive software; large scale integration; AES encryption circuits; LSI design; LSI manufacturing; LSI reliability; Trojan circuit detection; cipher key; malicious circuits; outsourcing services; payload unit; secret information leak; secret key; smart Trojan circuit; smart attack method; test mode signal lines; trigger unit; Clocks; Discrete Fourier transforms; AES Encryption Circuits; Design-for-Testability; Secure Design; Trojan Circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653619
  • Filename
    6653619