• DocumentCode
    2053067
  • Title

    Reconfigurable distributed fault tolerant routing algorithm for on-chip networks

  • Author

    Kumar, Manoj ; Pankaj ; Laxmi, V. ; Gaur, M.S. ; Seok-Bum Ko

  • Author_Institution
    Dept. of Comput. Eng., Malaviya Nat. Inst. of Technol., Jaipur, India
  • fYear
    2013
  • fDate
    2-4 Oct. 2013
  • Firstpage
    290
  • Lastpage
    295
  • Abstract
    Network on chip (NoC) is emerging as a promising solution to overcome bus bottleneck for future multi core chips. Fault tolerance and quality of service issues are potential challenges for NoCs. In this paper, we propose a cost-effective fault tolerant routing algorithm for irregular 2D mesh without use of routing tables. We use one hop visibility of Logic Based Distributed Routing (LBDR) to eliminate routing tables. This algorithm handles one or multiple single link faults within 2D mesh and uses reconfigured paths (minimal and/or non-minimal), if links fail. We use turn model based approach to avoid deadlocks. Since our method does not require virtual channels to achieve deadlock freedom, it remains area and power efficient.
  • Keywords
    fault tolerance; multiprocessing systems; network routing; network-on-chip; quality of service; reconfigurable architectures; LBDR; NoC; bus bottleneck; cost-effective fault tolerant routing algorithm; deadlock freedom; fault tolerance; hop visibility; irregular 2D mesh; logic based distributed routing; multicore chips; network on chip; on-chip networks; quality of service; reconfigurable distributed fault tolerant routing algorithm; reconfigured paths; routing tables; single link faults; turn model based approach; virtual channels; Algorithm design and analysis; Fault tolerance; Fault tolerant systems; Routing; Software algorithms; System recovery; Topology; LBDR; Networks on Chip; deadlock freedom; fault-tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4799-1583-5
  • Type

    conf

  • DOI
    10.1109/DFT.2013.6653621
  • Filename
    6653621