DocumentCode :
2053211
Title :
Interplay of microstructure and magnetic properties in epitaxially grown Co/sub 35/Pd/sub 65/ films on Cu/Si(100)
Author :
Jong-Ryul Jeong ; Sung-Chul Shin
Author_Institution :
Dept. of Phys., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2003
fDate :
March 30 2003-April 3 2003
Lastpage :
11
Abstract :
In this paper, we have investigate the correlation between magnetic properties, growth structure, and internal stress of epitaxially grown Co/sub 35/Pd/sub 65/ alloys films on Cu/Si(100).
Keywords :
cobalt alloys; crystal microstructure; ferromagnetic materials; internal stresses; magnetic anisotropy; magnetic epitaxial layers; magnetic hysteresis; metallic epitaxial layers; palladium alloys; CoPd; Cu-Si; Cu/Si(100) substrate; Si; epitaxially grown Co/sub 35/Pd/sub 65/ films; magnetic properties; microstructure; Coercive force; Hysteresis; Microstructure; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
Type :
conf
DOI :
10.1109/INTMAG.2003.1230737
Filename :
1230737
Link To Document :
بازگشت