Title :
Increasing test throughput through the implementation of parallel test on a 16-bit multimedia audio codec
Author :
Bogard, Harold ; Repasky, Celeste
Author_Institution :
Crystal Semicond. Corp., Austin, TX, USA
Abstract :
The cost of test is one of the most pressing issues faced by the semiconductor industry today. One important method for reducing the cost of testing is parallel test. Parallel test has been used successfully for many years for digital logic, memory, and analog integrated circuits, but is only now gaining popularity in the mixed signal industry. This paper explores the issues involved when deciding to use parallel test and describes the implementation of parallel test for a high performance, stereo, multimedia audio codec. Test time improvement and performance results are presented
Keywords :
audio coding; automatic test equipment; automatic test software; codecs; multimedia communication; telecommunication equipment testing; 16 bit; DUT board hardware; HP9490 Mixed Signal Test System; cost of test; high performance stereo codec; mixed signal industry; multimedia audio codec; parallel test; test software; test throughput; test time improvement; tester hardware; Analog integrated circuits; Circuit testing; Costs; Electronics industry; Integrated circuit testing; Logic circuits; Logic testing; Pressing; Semiconductor device testing; Throughput;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529862
