Increasing test throughput through the implementation of parallel test on a 16-bit multimedia audio codec

Author

Bogard, Harold ; Repasky, Celeste

Author_Institution

Crystal Semicond. Corp., Austin, TX, USA

fYear

1995

fDate

21-25 Oct 1995

Firstpage

370

Lastpage

376

Abstract

The cost of test is one of the most pressing issues faced by the semiconductor industry today. One important method for reducing the cost of testing is parallel test. Parallel test has been used successfully for many years for digital logic, memory, and analog integrated circuits, but is only now gaining popularity in the mixed signal industry. This paper explores the issues involved when deciding to use parallel test and describes the implementation of parallel test for a high performance, stereo, multimedia audio codec. Test time improvement and performance results are presented

Keywords

audio coding; automatic test equipment; automatic test software; codecs; multimedia communication; telecommunication equipment testing; 16 bit; DUT board hardware; HP9490 Mixed Signal Test System; cost of test; high performance stereo codec; mixed signal industry; multimedia audio codec; parallel test; test software; test throughput; test time improvement; tester hardware; Analog integrated circuits; Circuit testing; Costs; Electronics industry; Integrated circuit testing; Logic circuits; Logic testing; Pressing; Semiconductor device testing; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529862

Filename

529862