• DocumentCode
    2053398
  • Title

    At-speed delay characterization for IC authentication and Trojan Horse detection

  • Author

    Li, Jie ; Lach, John

  • Author_Institution
    Charles L. Brown Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA
  • fYear
    2008
  • fDate
    9-9 June 2008
  • Firstpage
    8
  • Lastpage
    14
  • Abstract
    New attacker scenarios involving integrated circuits (ICs) are emerging that pose a tremendous threat to national security. Concerns about overseas fabrication facilities and the protection of deployed ICs have given rise to methods for IC authentication (ensuring that an IC being used in a system has not been altered, replaced, or spoofed) and hardware Trojan Horse (HTH) detection (ensuring that an IC fabricated in a nonsecure facility contains the desired functionality and nothing more), but significant additional work is required to quell these treats. This paper discusses how a technique for precisely measuring the combinational delay of an arbitrarily large number of register-to-register paths internal to the functional portion of the IC can be used to provide the desired authentication and design alteration (including HTH implantation) detection. This low-cost delay measurement technique does not affect the main IC functionality and can be performed at-speed at both test-time and run-time.
  • Keywords
    integrated circuits; invasive software; IC authentication; Trojan horse detection; at-speed delay characterization; combinational delay; delay measurement technique; integrated circuits; national security; register-to-register paths; Authentication; Delay; Fabrication; Hardware; Integrated circuit testing; Invasive software; Measurement techniques; National security; Performance evaluation; Protection; IC authentication; hardware Trojan Horse detection; hardware security; path delay characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hardware-Oriented Security and Trust, 2008. HOST 2008. IEEE International Workshop on
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-4244-2401-6
  • Type

    conf

  • DOI
    10.1109/HST.2008.4559038
  • Filename
    4559038