Title :
Using target faults to detect non-target defects
Author :
Wang, Li.-C. ; Mercer, M. Ray ; Williams, Thomas W.
Abstract :
The traditional ATPG method relies upon faults to target all defects. Since faults do not model all possible defects, testing quality depends on the fortuitous detection of non-target defects. By analyzing different ATPG approaches, this paper intends to identify critical factors that may greatly affect the fortuitous detection. For enhancing the fortuitous detection of non-target defects through target faults, new concepts and novel ATPG methods are proposed
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; logic testing; ATPG methods; DROP; WEIGHT; bridging faults; defect conflict factor; fortuitous detection; nontarget defect detection; stuck-at fault test; target faults; test space restriction; testing quality; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Computational modeling; Fault detection; Manufacturing; Performance evaluation; Predictive models; Semiconductor device testing;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557120
