Title :
Encapsulant for non-hermetic multichip packaging applications
Author :
Lin, A.W. ; Wong, C.P.
Author_Institution :
AT&T Bell Labs, Murray Hill, NJ, USA
Abstract :
The authors present an encapsulant, study that identifies a robust silicone material suitable for MCP (multichip packaging) applications. In the study, the properties/characteristics of encapsulant needed for MCP applications were identified. A literature survey then led to the selection of six types of encapsulants for a screening test. The encapsulants were tested at 85°C/85% relative humidity with DC bias and in-situ leakage current monitoring. A modified silicone encapsulant (MSE) was identified as the most promising material and was subjected to more in-depth studies. Test samples encapsulated with MSE were exposed to five selected chemicals to study their chemical resistance. The samples were then subjected to a temperature-humidity-bias test. for moisture protection studies in addition, studies such as material formulation, adhesion, mechanical protection, and temperature cycling were conducted
Keywords :
encapsulation; hybrid integrated circuits; integrated circuit technology; packaging; 85 degC; adhesion; chemical resistance; encapsulant; leakage current monitoring; material formulation; mechanical protection; moisture protection; multichip packaging; nonhermetic packaging; screening test; silicone material; temperature-humidity-bias test; Chemicals; Conducting materials; Humidity; Leakage current; Materials testing; Moisture; Monitoring; Packaging; Protection; Robustness;
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
DOI :
10.1109/ECTC.1991.163974