DocumentCode
2053662
Title
Encapsulant for non-hermetic multichip packaging applications
Author
Lin, A.W. ; Wong, C.P.
Author_Institution
AT&T Bell Labs, Murray Hill, NJ, USA
fYear
1991
fDate
11-16 May 1991
Firstpage
820
Lastpage
826
Abstract
The authors present an encapsulant, study that identifies a robust silicone material suitable for MCP (multichip packaging) applications. In the study, the properties/characteristics of encapsulant needed for MCP applications were identified. A literature survey then led to the selection of six types of encapsulants for a screening test. The encapsulants were tested at 85°C/85% relative humidity with DC bias and in-situ leakage current monitoring. A modified silicone encapsulant (MSE) was identified as the most promising material and was subjected to more in-depth studies. Test samples encapsulated with MSE were exposed to five selected chemicals to study their chemical resistance. The samples were then subjected to a temperature-humidity-bias test. for moisture protection studies in addition, studies such as material formulation, adhesion, mechanical protection, and temperature cycling were conducted
Keywords
encapsulation; hybrid integrated circuits; integrated circuit technology; packaging; 85 degC; adhesion; chemical resistance; encapsulant; leakage current monitoring; material formulation; mechanical protection; moisture protection; multichip packaging; nonhermetic packaging; screening test; silicone material; temperature-humidity-bias test; Chemicals; Conducting materials; Humidity; Leakage current; Materials testing; Moisture; Monitoring; Packaging; Protection; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-0012-2
Type
conf
DOI
10.1109/ECTC.1991.163974
Filename
163974
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