• DocumentCode
    2053662
  • Title

    Encapsulant for non-hermetic multichip packaging applications

  • Author

    Lin, A.W. ; Wong, C.P.

  • Author_Institution
    AT&T Bell Labs, Murray Hill, NJ, USA
  • fYear
    1991
  • fDate
    11-16 May 1991
  • Firstpage
    820
  • Lastpage
    826
  • Abstract
    The authors present an encapsulant, study that identifies a robust silicone material suitable for MCP (multichip packaging) applications. In the study, the properties/characteristics of encapsulant needed for MCP applications were identified. A literature survey then led to the selection of six types of encapsulants for a screening test. The encapsulants were tested at 85°C/85% relative humidity with DC bias and in-situ leakage current monitoring. A modified silicone encapsulant (MSE) was identified as the most promising material and was subjected to more in-depth studies. Test samples encapsulated with MSE were exposed to five selected chemicals to study their chemical resistance. The samples were then subjected to a temperature-humidity-bias test. for moisture protection studies in addition, studies such as material formulation, adhesion, mechanical protection, and temperature cycling were conducted
  • Keywords
    encapsulation; hybrid integrated circuits; integrated circuit technology; packaging; 85 degC; adhesion; chemical resistance; encapsulant; leakage current monitoring; material formulation; mechanical protection; moisture protection; multichip packaging; nonhermetic packaging; screening test; silicone material; temperature-humidity-bias test; Chemicals; Conducting materials; Humidity; Leakage current; Materials testing; Moisture; Monitoring; Packaging; Protection; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1991. Proceedings., 41st
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-0012-2
  • Type

    conf

  • DOI
    10.1109/ECTC.1991.163974
  • Filename
    163974