DocumentCode
2053775
Title
Microwave scanning tomography local unit defects
Author
Melnyk, S.I. ; Slipchenko, M.I.
Author_Institution
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
fYear
2010
fDate
23-27 Feb. 2010
Firstpage
71
Lastpage
71
Abstract
This article analyzes the possibility of creating a microwave scanning tomography on the basis of existing microwave microscopes. An algorithm for the reconstruction of the size, depth and electrical parameters of the local unit heterogeneity on the basis of scanning at two at two different distances between the sensor and object.
Keywords
image reconstruction; microscopes; microwave imaging; tomography; local unit defects; local unit heterogeneity; microwave microscopes; microwave scanning tomography; size reconstruction; Atom optics; Equations; Force measurement; Microwave sensors; Nonuniform electric fields; Optical microscopy; Optical resonators; Signal resolution; Size measurement; Tomography; local unit defects; microwave scanning tomography; reconstruction; resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location
Lviv-Slavske
Print_ISBN
978-966-553-875-2
Electronic_ISBN
978-966-553-901-8
Type
conf
Filename
5446028
Link To Document