Title :
Microwave scanning tomography local unit defects
Author :
Melnyk, S.I. ; Slipchenko, M.I.
Author_Institution :
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
Abstract :
This article analyzes the possibility of creating a microwave scanning tomography on the basis of existing microwave microscopes. An algorithm for the reconstruction of the size, depth and electrical parameters of the local unit heterogeneity on the basis of scanning at two at two different distances between the sensor and object.
Keywords :
image reconstruction; microscopes; microwave imaging; tomography; local unit defects; local unit heterogeneity; microwave microscopes; microwave scanning tomography; size reconstruction; Atom optics; Equations; Force measurement; Microwave sensors; Nonuniform electric fields; Optical microscopy; Optical resonators; Signal resolution; Size measurement; Tomography; local unit defects; microwave scanning tomography; reconstruction; resolution;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-966-553-875-2
Electronic_ISBN :
978-966-553-901-8
